Low-Temperature Characterization of Cu–Cu:Silica-Based Programmable Metallization Cell
書誌事項
- 公開日
- 2017-09
- 権利情報
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/led.2017.2734743
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Electron Device Letters
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IEEE Electron Device Letters 38 (9), 1244-1247, 2017-09
Institute of Electrical and Electronics Engineers (IEEE)
