説明
<jats:p> AlN was grown by a sublimation method on 6H-SiC. We found the grown AlN layer is easily separated from the substrate when Si powder is added to the AlN source powder. The formation of AlSiN layer with the Si content of 15% at the AlN/6H-SiC interface was confirmed by energy-dispersive X-ray spectroscopy (EDS) and X-ray diffraction (XRD). This AlSiN layer causes the separation of AlN. </jats:p>
収録刊行物
-
- Japanese Journal of Applied Physics
-
Japanese Journal of Applied Physics 52 (8S), 08JA07-, 2013-05-31
IOP Publishing
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1360847874817560320
-
- NII論文ID
- 210000142592
-
- ISSN
- 13474065
- 00214922
-
- データソース種別
-
- Crossref
- CiNii Articles