Thickness‐Dependent Structure–Property Relationships in Strained (110) SrRuO<sub>3</sub> Thin Films

書誌事項

公開日
2012-10-04
資源種別
journal article
権利情報
  • http://onlinelibrary.wiley.com/termsAndConditions#vor
DOI
  • 10.1002/adfm.201202402
公開者
Wiley

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説明

<jats:title>Abstract</jats:title><jats:p>Thickness‐dependent structure–property relationships in strained SrRuO<jats:sub>3</jats:sub> thin films on GdScO<jats:sub>3</jats:sub> (GSO) substrates are reported. The film is found to have epitaxially stabilized crystal structures that vary with the film thickness. Below 16 nm, the √2<jats:italic>a</jats:italic><jats:sub>pc</jats:sub> × √2<jats:italic>a</jats:italic><jats:sub>pc</jats:sub> × 2<jats:italic>a</jats:italic><jats:sub>pc</jats:sub> monoclinic structure is stabilized while above 16 nm the film has the <jats:italic>a</jats:italic><jats:sub>pc</jats:sub> × 2<jats:italic>a</jats:italic><jats:sub>pc</jats:sub> × <jats:italic>a</jats:italic><jats:sub>pc</jats:sub> tetragonal structure. The thickness‐dependent structural changes are ascribed to the substrate‐induced modification in the RuO<jats:sub>6</jats:sub> octahedral rotation pattern, which highlights the significance of the octahedral rotations for the epitaxial strain accommodation in the coherently‐grown films. Close relationships between the structural and physical properties of the films are also found. The monoclinic film has the uniaxial magnetic easy axis 45° away from the [110]<jats:sub>GSO</jats:sub> direction while the tetragonal film has the one that lies along the in‐plane [1–10]<jats:sub>GSO</jats:sub> direction. The results demonstrate that the octahedral rotations in the strained perovskite oxide thin films are a key factor for determining their structure phases and physical properties.</jats:p>

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