Quantitative Characterization of SOFC Nickel-YSZ Anode Microstructure Degradation Based on Focused-Ion-Beam 3D-Reconstruction Technique

詳細情報 詳細情報について

• CRID

  1360848661242761728

• DOI

  10.1149/2.045203jes

• ISSN

  19457111

  00134651

• Web Site

  https://syndication.highwire.org/content/doi/10.1149/2.045203jes

• 資料種別

  journal article

• データソース種別

  • Crossref
  • KAKEN