Focus characterization of an X-ray free-electron laser by intensity correlation measurement of X-ray fluorescence
抄録
<jats:p>This paper proposes and demonstrates a simple method using the intensity correlation of X-ray fluorescence to evaluate the focused beam size of an X-ray free-electron laser (XFEL). This method was applied to the sub-micrometre focused XFEL beam at the SPring-8 Angstrom Compact Free Electron Laser, and the beam size evaluated using the proposed method was consistent with that measured using the knife-edge scan method. The proposed method is readily applicable to extremely small X-ray spots and can be applied for the precise diagnostics of sub-10 nm focused X-ray beams which have recently emerged.</jats:p>
収録刊行物
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- Journal of Synchrotron Radiation
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Journal of Synchrotron Radiation 27 (5), 1366-1371, 2020-08-17
International Union of Crystallography (IUCr)