XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures

Details 詳細情報について

• CRID

  1360855569053883264

• DOI

  10.1016/j.elspec.2011.04.002

• ISSN

  03682048

• Web Site

  https://api.elsevier.com/content/article/PII:S0368204811000727?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0368204811000727?httpAccept=text/plain

• Data Source

  • Crossref