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- Subramanian B
- CSIR-Central Electrochemical Research Institute 1 , Karaikudi 630003, India
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- Thanka Rajan S
- CSIR-Central Electrochemical Research Institute 1 , Karaikudi 630003, India
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- P. J. Martin
- CSIRO Manufacturing Business Unit 2 , Lindfield, Sydney, New South Wales 2070, Australia
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- Vijay Vaithilingam
- CSIRO Manufacturing Business Unit 4 , North Ryde, New South Wales 2113, Australia
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- Penelope A. Bean
- CSIRO Manufacturing Business Unit 4 , North Ryde, New South Wales 2113, Australia
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- Margaret D. M. Evans
- CSIRO Manufacturing Business Unit 4 , North Ryde, New South Wales 2113, Australia
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- A. Bendavid
- CSIRO Manufacturing Business Unit 2 , Lindfield, Sydney, New South Wales 2070, Australia
抄録
<jats:p>Diamond like carbon (DLC) films were deposited onto Ti6Al4V and Si wafer substrates by RF plasma enhanced chemical vapor deposition. The influence of dopants such as fluorine (F), silicon (Si), and nitrogen (N) on composition, structure, and biocompatibility was investigated. Ion scattering spectroscopy analysis revealed the presence of dopant atoms in the outer-most layers of the films. Raman studies showed that the position of the G-band shifts to higher frequencies with the fluorine and nitrogen content in the DLC film, whereas the incorporation of Si into DLC induces a decrease of the position of the G peak. The corrosion behavior was studied in simulated body fluid. A higher charge transfer resistance (Rct) was observed for the doped DLC films. The indirect cytotoxicity was performed using L929 fibroblast cells. The coated surfaces were hemocompatible when tested with red blood cells. DLC films were noncytotoxic to L929 cells over a 24 h exposure. Saos-2 osteoblast cell response to the doped and undoped DLC coated surfaces was studied in adhesion, proliferation, differentiation, and mineralization assays. The production of calcium and phosphate by cells on doped DLC, particularly, nitrogen doped DLC, was higher than that on undoped DLC.</jats:p>
収録刊行物
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- Biointerphases
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Biointerphases 13 (4), 2018-05-22
American Vacuum Society
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キーワード
詳細情報 詳細情報について
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- CRID
- 1360855570608932352
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- ISSN
- 15594106
- 19348630
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- データソース種別
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- Crossref