Suppression of corner effects in wide-channel triple-gate bulk FinFETs

詳細情報 詳細情報について

• CRID

  1360855571190383744

• DOI

  10.1016/j.mee.2009.07.013

• ISSN

  01679317

• Web Site

  https://api.elsevier.com/content/article/PII:S0167931709005073?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0167931709005073?httpAccept=text/plain

• データソース種別

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