Surface modification of iron oxides by ion bombardment – Comparing depth profiling by HAXPES and Ar ion sputtering

詳細情報 詳細情報について

• CRID

  1360857597434739712

• DOI

  10.1016/j.elspec.2017.09.008

• ISSN

  03682048

• Web Site

  https://api.elsevier.com/content/article/PII:S0368204816302109?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0368204816302109?httpAccept=text/plain

• データソース種別

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