Soft errors in DNN accelerators: A comprehensive review
Journal
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- Microelectronics Reliability
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Microelectronics Reliability 115 113969-, 2020-12
Elsevier BV
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Details 詳細情報について
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- CRID
- 1360857597955219328
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- ISSN
- 00262714
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- Data Source
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- Crossref