Dependency-Aware Web Test Generation

DOI PDF 1 Citations

Journal

2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST)

2020 IEEE 13th International Conference on Software Testing, Validation and Verification (ICST) 175-185, 2020-10

IEEE

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Details 詳細情報について

CRID

1360861293092185856
DOI

10.1109/icst46399.2020.00027
Web Site

http://xplorestaging.ieee.org/ielx7/9149738/9159045/09159067.pdf?arnumber=9159067
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