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- Fernando Fernandes dos Santos
- Institute of Informatics, Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
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- Pedro Foletto Pimenta
- Institute of Informatics, Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
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- Caio Lunardi
- Institute of Informatics, Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
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- Lucas Draghetti
- Institute of Informatics, Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
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- Luigi Carro
- Institute of Informatics, Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
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- David Kaeli
- Dana Research Center, Department of Electrical and Computer Engineering, Northeastern University Boston, MA, USA
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- Paolo Rech
- Institute of Informatics, Federal University of Rio Grande do Sul (UFRGS), Porto Alegre, Brazil
収録刊行物
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- IEEE Transactions on Reliability
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IEEE Transactions on Reliability 68 (2), 663-677, 2019-06
Institute of Electrical and Electronics Engineers (IEEE)