Automated Labeling and Learning for Physical Layer Authentication Against Clone Node and Sybil Attacks in Industrial Wireless Edge Networks
書誌事項
- 公開日
- 2021-03
- 権利情報
-
- https://creativecommons.org/licenses/by/4.0/legalcode
- DOI
-
- 10.1109/tii.2020.2963962
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
-
- IEEE Transactions on Industrial Informatics
-
IEEE Transactions on Industrial Informatics 17 (3), 2041-2051, 2021-03
Institute of Electrical and Electronics Engineers (IEEE)