Automatic epileptic seizure detection in EEGs based on optimized sample entropy and extreme learning machine

DOI Web Site Web Site 1 Citations

Journal

Journal of Neuroscience Methods

Journal of Neuroscience Methods 210 (2), 132-146, 2012-09

Elsevier BV

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Details 詳細情報について

CRID

1360861713053215488
DOI

10.1016/j.jneumeth.2012.07.003
ISSN

01650270
Web Site

https://api.elsevier.com/content/article/PII:S0165027012002671?httpAccept=text/xml

https://api.elsevier.com/content/article/PII:S0165027012002671?httpAccept=text/plain
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