EHD Film Thickness in Non-Steady State Contacts

DOI PDF 被引用文献4件
  • J. Sugimura
    Department of Energy and Mechanical Engineering, Kyushu University, Hakozaki, Higashi-ku, Fukuoka 812-81, Japan
  • W. R. Jones
    NASA Lewis Research Center, Cleveland, OH 44135
  • H. A. Spikes
    Tribology Section, Imperial College, Exhibition Road, London SW7 2BX, United Kingdom

書誌事項

公開日
1998-07-01
DOI
  • 10.1115/1.2834569
公開者
ASME International

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説明

<jats:p>This paper describes a study of EHD film thickness in non-steady state contact conditions. A modification of ultrathin film interferometry is employed which is able to measure both central film thickness and film thickness profiles 50 times a second. Film thickness with two perfluoropolyethers and two mineral base oils are investigated in a number of different types of non-steady state motion, including acceleration/deceleration, stop/start and reciprocation. The results demonstrate a range of transient behaviors of EHD film whose thicknesses deviate from those in steady state conditions.</jats:p>

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