Hierarchical test generation using precomputed tests for modules
Bibliographic Information
- Published
- 1990-06
- Rights Information
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/43.55189
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
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Journal
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- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 9 (6), 594-603, 1990-06
Institute of Electrical and Electronics Engineers (IEEE)
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Details 詳細情報について
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- CRID
- 1361137044313074048
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- NII Article ID
- 80005185058
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- DOI
- 10.1109/43.55189
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- ISSN
- 02780070
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- Data Source
-
- Crossref
- CiNii Articles