Application of electrical capacitance tomography to the void fraction measurement of two-phase flow
書誌事項
- 公開日
- 2003-02
- 権利情報
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/tim.2003.809087
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Instrumentation and Measurement
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IEEE Transactions on Instrumentation and Measurement 52 (1), 7-12, 2003-02
Institute of Electrical and Electronics Engineers (IEEE)