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Effect of cesium and xenon seeding in negative hydrogen ion sources
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- M. Bacal
- Laboratoire de Physique des Milieux Ionisés, U.M.R. 7648 du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- A. M. Bruneteau
- Laboratoire de Physique des Milieux Ionisés, U.M.R. 7648 du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- C. Deniset
- Laboratoire de Physique des Milieux Ionisés, U.M.R. 7648 du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- L. I. Elizarov
- Laboratoire de Physique des Milieux Ionisés, U.M.R. 7648 du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- F. Sube
- Laboratoire de Physique des Milieux Ionisés, U.M.R. 7648 du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- A. Y. Tontegode
- Laboratoire de Physique des Milieux Ionisés, U.M.R. 7648 du C.N.R.S., Ecole Polytechnique, 91128 Palaiseau, France
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- J. H. Whealton
- Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-8088
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Description
<jats:p>It is well known that cesium seeding in volume hydrogen negative ion sources leads to a large reduction of the extracted electron current and in some cases to the enhancement of the negative ion current. The cooling of the electrons due to the addition of this heavy impurity was proposed as a possible cause of the mentioned observations. In order to verify this assumption, we seeded the hydrogen plasma with xenon, which has an atomic weight almost equal to that of cesium. The plasma properties were studied in the extraction region of the negative ion source Camembert III using a cylindrical electrostatic probe while the negative ion relative density was studied using laser photodetachment. It is shown that the xenon mixing does not enhance the negative ion density and leads to the increase of the electron density, while the cesium seeding reduces the electron density.</jats:p>
Journal
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- Review of Scientific Instruments
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Review of Scientific Instruments 71 (2), 1082-1085, 2000-02-01
AIP Publishing
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Keywords
Details 詳細情報について
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- CRID
- 1361137045138890624
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- ISSN
- 10897623
- 00346748
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- Data Source
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- Crossref