Improvement of X-ray stress measurement from a Debye–Scherrer ring by oscillation of the X-ray incident angle
説明
<jats:p>A technique to improve the stress measurement from a Debye–Scherrer ring (D–S ring) is reported. In a previous work, the authors reported a technique to calculate stress from the Fourier series of the normal strain of a D–S ring. That technique, similar to the cos<jats:italic>α</jats:italic> method that came before it, is inaccurate when the grain size of the specimen is relatively large. To cope with this problem, the authors propose using the oscillation of the X-ray incident angle. The present study demonstrates this technique to improve the stress measurement.</jats:p>
収録刊行物
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- Powder Diffraction
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Powder Diffraction 30 (3), 250-255, 2015-08-12
Cambridge University Press (CUP)
