Void and phase evolution during the processing of Bi-2212 superconducting wires monitored by combined fast synchrotron micro-tomography and x-ray diffraction
書誌事項
- 公開日
- 2011-09-30
- DOI
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- 10.1088/0953-2048/24/11/115004
- 公開者
- IOP Publishing
この論文をさがす
収録刊行物
-
- Superconductor Science and Technology
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Superconductor Science and Technology 24 (11), 115004-, 2011-09-30
IOP Publishing