Structural studies of disordered materials using high-energy x-ray diffraction from ambient to extreme conditions
書誌事項
- 公開日
- 2007-11-08
- DOI
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- 10.1088/0953-8984/19/50/506101
- 公開者
- IOP Publishing
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説明
High-energy x-rays from a synchrotron radiation source allow us to obtain high-quality diffraction data for disordered materials from ambient to extreme conditions, which is necessary for revealing the detailed structures of glass, liquid and amorphous materials. We introduced high-energy x-ray diffraction beamlines and a dedicated diffractometer for glass, liquid and amorphous materials at SPring-8 and report the recent developments of ancillary equipment. Furthermore, the structures of liquid and amorphous materials determined from the high-energy x-ray diffraction data obtained at SPring-8 are discussed.
収録刊行物
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- Journal of Physics: Condensed Matter
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Journal of Physics: Condensed Matter 19 (50), 506101-, 2007-11-08
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1361137046453928192
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- ISSN
- 1361648X
- 09538984
- https://id.crossref.org/issn/09538984
- http://id.crossref.org/issn/09538984
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- データソース種別
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- Crossref
- OpenAIRE
