Amorphous and crystallized Ge–Sb–Te thin films deposited by pulsed laser: Local structure using Raman scattering spectroscopy
書誌事項
- 公開日
- 2012-10
- 権利情報
-
- https://www.elsevier.com/tdm/userlicense/1.0/
- DOI
-
- 10.1016/j.matchemphys.2012.08.024
- 公開者
- Elsevier BV
この論文をさがす
収録刊行物
-
- Materials Chemistry and Physics
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Materials Chemistry and Physics 136 (2-3), 935-941, 2012-10
Elsevier BV
