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- F. Pfeiffer
- Department of Physics 1 , Technische Universität München, 85748 Garching, Germany
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- M. Bech
- University of Copenhagen 2 Niels Bohr Institute, , 2100 Copenhagen, Denmark
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- O. Bunk
- Paul Scherrer Institut 3 , 5232 Villigen PSI, Switzerland
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- T. Donath
- Paul Scherrer Institut 3 , 5232 Villigen PSI, Switzerland
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- B. Henrich
- Paul Scherrer Institut 3 , 5232 Villigen PSI, Switzerland
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- P. Kraft
- Paul Scherrer Institut 3 , 5232 Villigen PSI, Switzerland
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- C. David
- Paul Scherrer Institut 3 , 5232 Villigen PSI, Switzerland
説明
<jats:p>In this letter, we report results obtained with a recently developed approach for grating-based x-ray dark-field imaging [F. Pfeiffer et al., Nat. Mater. 7, 134 (2008)]. Since the image contrast is formed through the mechanism of small-angle scattering, it provides complementary and otherwise inaccessible structural information about the specimen at the micron and submicron length scales. Our approach is fully compatible with conventional transmission radiography and the grating-based hard x-ray phase-contrast imaging scheme [F. Pfeiffer et al., Nat. Phys. 2, 258 (2006)]. Since it can be used with standard x-ray tube sources, we envisage widespread applications to x-ray medical imaging, industrial nondestructive testing, or security screening.</jats:p>
収録刊行物
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- Journal of Applied Physics
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Journal of Applied Physics 105 (10), 2009-05-15
AIP Publishing