Carrier Time-of-Flight Measurement Using a Probe Structure for Direct Evaluation of Carrier Transport in Multiple Quantum Well Solar Cells

DOI PDF 6 Citations

Journal

IEEE Journal of Photovoltaics

IEEE Journal of Photovoltaics 4 (6), 1518-1525, 2014-11

Institute of Electrical and Electronics Engineers (IEEE)

Citations (6)*help

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Details 詳細情報について

CRID

1361418519496595968
DOI

10.1109/jphotov.2014.2354256
ISSN

21563403

21563381
Web Site

http://xplorestaging.ieee.org/ielx7/5503869/6928522/06905707.pdf?arnumber=6905707
Data Source
- Crossref

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