Subband structure engineering for performance enhancement of Si MOSFETs

書誌事項

公開日
2002-11-23
DOI
  • 10.1109/iedm.1997.650345
公開者
IEEE

説明

This paper presents a new strategy to enhance the current drive of Si MOSFETs, utilizing a subband structure engineering. It is found that SOI MOSFETs with SOI thickness thinner than the inversion layer of bulk MOSFETs can provide higher current drive than bulk MOSFETs, because of the significant modulation of the subband structure. This performance enhancement is attributed to the increase in both the inversion-layer mobility and the inversion-layer capacitance.

収録刊行物

被引用文献 (4)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ