Dielectric Anomaly in Mg Doped ZnO Thin Film Deposited by Sol–Gel Method

詳細情報 詳細情報について

• CRID

  1361418519943665536

• DOI

  10.1149/1.3511788

• ISSN

  00134651

• Web Site

  https://syndication.highwire.org/content/doi/10.1149/1.3511788

• データソース種別

  • Crossref