-
- U. O. Karlsson
- IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
-
- F. J. Himpsel
- IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
-
- J. F. Morar
- IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
-
- D. Rieger
- IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
-
- J. A. Yarmoff
- IBM T. J. Watson Research Center, Yorktown Heights, New York 10598
この論文をさがす
説明
<jats:p>High resolution core level spectroscopy, polarization-dependent near edge x-ray absorption fine structure and angle-resolved photoemission have been used to study CaF2 grown by molecular beam epitaxy on Si(111). It is found that both Ca and F bond to Si at the interface and that both Ca and F-derived interface states are created. A new radiation induced ordered structure is also reported.</jats:p>
収録刊行物
-
- Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena
-
Journal of Vacuum Science & Technology B: Microelectronics Processing and Phenomena 4 (4), 1117-1120, 1986-07-01
American Vacuum Society
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1361418520703862528
-
- NII論文ID
- 30020318961
-
- DOI
- 10.1116/1.583552
-
- ISSN
- 23279877
- 0734211X
-
- データソース種別
-
- Crossref
- CiNii Articles