Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements

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  • Ozgur Sahin
    Harvard University The Rowland Institute at Harvard, , Cambridge, Massachusetts 02142, USA

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<jats:p>Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever. Specifically the transitions between steady oscillation regimes are used to calibrate the torsional deflection signals.</jats:p>

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