Silicon knife-edge taper waveguide for ultralow-loss spot-size converter fabricated by photolithography
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- R. Takei
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
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- M. Suzuki
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
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- E. Omoda
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
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- S. Manako
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
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- T. Kamei
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
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- M. Mori
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
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- Y. Sakakibara
- National Institute of Advanced Industrial Science and Technology (AIST) , Tsukuba, Ibaraki, 305-8568, Japan and Institute for Photonics-Electronics Convergence System Technology (PECST), Tsukuba, Ibaraki, 305-8568, Japan
Abstract
<jats:p>For ultralow-loss and polarization-insensitive spot-size converters (SSCs) on a silicon platform, we propose and demonstrate a silicon knife-edge taper waveguide with a gradual decrease in height as well as width toward the taper end. The taper was fabricated using a double-patterning method involving i-line stepper photolithography and angled sidewall dry-etching. The SSC, with the knife-edge taper covered with a polymer secondary core, exhibited mode conversion losses of 0.35 and 0.21 dB for transverse electric-like and transverse magnetic-like modes, respectively.</jats:p>
Journal
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- Applied Physics Letters
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Applied Physics Letters 102 (10), 101108-, 2013-03-11
AIP Publishing
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Details 詳細情報について
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- CRID
- 1361418521195506560
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- ISSN
- 10773118
- 00036951
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- Data Source
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- Crossref