Combined photoemission/<i>in vacuo</i> transport study of the indium tin oxide/copper phthalocyanine/N,N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-4,4″diamine molecular organic semiconductor system

DOI PDF 被引用文献7件
  • I. G. Hill
    Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544
  • A. Kahn
    Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

書誌事項

公開日
1999-08-15
DOI
  • 10.1063/1.371018
公開者
AIP Publishing

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説明

<jats:p>Ultraviolet photoemission spectroscopy (UPS) was used to study the indium tin oxide/copper phthalocyanine (CuPc) and CuPc/N,N′-diphenyl-N,N′-bis(l-naphthyl)-1,1′biphenyl-1-4,4″diamine interfaces, which are commonly used as an anode/hole injection layer/hole transport layer combination in organic light emitting devices. In order to assess the validity of the transport barriers measured using UPS, in vacuo I–V measurements have been performed on simple devices grown and measured in the same system as the samples studied using UPS. I–V characteristics were modeled using numerical simulations. The parameters used in the simulated curves which best fit the measured I–V characteristics agree quantitatively with the UPS measured barriers.</jats:p>

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