Consensus among multiple approaches as a reliability measure for flexible fitting into cryo-EM data

Details 詳細情報について

• CRID

  1361418521268090752

• DOI

  10.1016/j.jsb.2013.02.002

• ISSN

  10478477

• Web Site

  https://api.elsevier.com/content/article/PII:S1047847713000270?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S1047847713000270?httpAccept=text/plain

• Data Source

  • Crossref