A Novel Measurement Technique of Pure Out-of-Plane Vibrational Modes in Thin Films on a Nonmetallic Material with No Polarizer

  • Takeshi Hasegawa
    Kobe Pharmaceutical University, Motoyama-kita, Higashinada-ku, Kobe 658-8558, Japan

書誌事項

公開日
2002-03-27
DOI
  • 10.1021/jp013751b
  • 10.1021/jp0306040
公開者
American Chemical Society (ACS)

この論文をさがす

説明

A novel measurement technique has been developed to simultaneously obtain polarized spectra of in-plane (IP) and out-of-plane (OP) vibrational modes in optically thin films deposited on a nonmetallic substrate without using a polarizer. These spectra correspond to the conventional infrared transmission and reflection−absorption (RA) spectra, respectively. It has been commonly believed that the mode-selective measurements require polarizers and a specific surface. In particular, the OP-mode measurements always require a metallic surface to generate the surface-normal electric field in the films. The present technique overcomes the limitations of the measurements by considering the concept of virtual longitudinal-wave light using a new arithmetic regression model. The nonpolarized transmitted infrared ray through thin films on a transparent material (Ge) was collected at different angles of incidence, and the transmittance single-beam spectra were subjected to the chemometric spectral resolution, so that ab...

収録刊行物

被引用文献 (66)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ