A Novel Measurement Technique of Pure Out-of-Plane Vibrational Modes in Thin Films on a Nonmetallic Material with No Polarizer
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- Takeshi Hasegawa
- Kobe Pharmaceutical University, Motoyama-kita, Higashinada-ku, Kobe 658-8558, Japan
書誌事項
- 公開日
- 2002-03-27
- DOI
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- 10.1021/jp013751b
- 10.1021/jp0306040
- 公開者
- American Chemical Society (ACS)
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説明
A novel measurement technique has been developed to simultaneously obtain polarized spectra of in-plane (IP) and out-of-plane (OP) vibrational modes in optically thin films deposited on a nonmetallic substrate without using a polarizer. These spectra correspond to the conventional infrared transmission and reflection−absorption (RA) spectra, respectively. It has been commonly believed that the mode-selective measurements require polarizers and a specific surface. In particular, the OP-mode measurements always require a metallic surface to generate the surface-normal electric field in the films. The present technique overcomes the limitations of the measurements by considering the concept of virtual longitudinal-wave light using a new arithmetic regression model. The nonpolarized transmitted infrared ray through thin films on a transparent material (Ge) was collected at different angles of incidence, and the transmittance single-beam spectra were subjected to the chemometric spectral resolution, so that ab...
収録刊行物
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- The Journal of Physical Chemistry B
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The Journal of Physical Chemistry B 106 (16), 4112-4115, 2002-03-27
American Chemical Society (ACS)
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詳細情報 詳細情報について
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- CRID
- 1361418521399450752
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- ISSN
- 15205207
- 15206106
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- データソース種別
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- Crossref
- OpenAIRE

