On-machine and in-process surface metrology for precision manufacturing

DOI HANDLE Web Site Web Site 被引用文献55件 参考文献236件

書誌事項

公開日
2019
資源種別
journal article
権利情報
  • https://www.elsevier.com/tdm/userlicense/1.0/
  • https://www.elsevier.com/legal/tdmrep-license
DOI
  • 10.1016/j.cirp.2019.05.005
公開者
Elsevier BV

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説明

Abstract On-machine and in-process surface metrology are important for quality control in manufacturing of precision surfaces. The classifications, requirements and tasks of on-machine and in-process surface metrology are addressed. The state-of-the-art on-machine and in-process measurement systems and sensor technologies are presented. Error separation algorithms for removing machine tool errors, which is specially required in on-machine and in-process surface metrology, are overviewed, followed by a discussion on calibration and traceability. Advanced techniques on sampling strategies, measurement systems-machine tools interface, data flow and analysis as well as feedbacks for compensation manufacturing are then demonstrated. Future challenges and developing trends are also discussed.

収録刊行物

  • CIRP Annals

    CIRP Annals 68 (2), 843-866, 2019

    Elsevier BV

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