Automatic detection of defect positions including interface dislocations and strain measurement in Ge/Si heterostructure from moiré phase processing of TEM image

Details 詳細情報について

• CRID

  1361694367043061760

• DOI

  10.1016/j.optlaseng.2020.106077

• ISSN

  01438166

• Web Site

  https://api.elsevier.com/content/article/PII:S0143816619320445?httpAccept=text/xml

  https://api.elsevier.com/content/article/PII:S0143816619320445?httpAccept=text/plain

• Data Source

  • Crossref
  • KAKEN