The quantitative analysis of thin specimens

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書誌事項

公開日
1975-03
権利情報
  • http://onlinelibrary.wiley.com/termsAndConditions#vor
DOI
  • 10.1111/j.1365-2818.1975.tb03895.x
公開者
Wiley

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説明

<jats:title>SUMMARY</jats:title><jats:p>Results are reported concerning the use of an energy dispersive X‐ray detector to carry out the analysis of thin foils in the electron microscope. The combination of a thin specimen and the extreme stability of the energy dispersive X‐ray detector enables the experimental determination of a calibration curve of X‐ray production—detection efficiency vs characteristic X‐ray energy. Quantitative analysis can be carried out using the calibration curve without reference to standards at the time of analysis.</jats:p>

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