The Basic Reactions, Compositions, and Electrical Properties of Pd-Ag Thick-Film Resistors
書誌事項
- 公開日
- 1973-06
- 権利情報
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/tphp.1973.1136715
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
説明
The basic reactions, compositions, and electrical properties of glazed Pd-Ag sintered layers through a firing process have been examined by differential thermal analysis, thermograviometric analysis, and X-ray diffraction analysis. The evaporation and combustion of screening vehicle and solvents, the oxidation-reduction behaviors of Pd and Ag the creation of PdAg solid solution, and the electrical properties and stability of these resistors have been studied. From these tests it was found that the degree of process sensitivity for these resistors was high, and electrical properties and stability of these resistors were affected in much the same way by firing temperature and firing period. They were influenced most by temperature rise rate and least by temperature fall rate.
収録刊行物
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- IEEE Transactions on Parts, Hybrids, and Packaging
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IEEE Transactions on Parts, Hybrids, and Packaging 9 (2), 104-114, 1973-06
Institute of Electrical and Electronics Engineers (IEEE)
