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- J. I. Raffel
- MIT Lincoln Laboratory, Lexington, Massachusetts 02173
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- J. F. Freidin
- MIT Lincoln Laboratory, Lexington, Massachusetts 02173
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- G. H. Chapman
- MIT Lincoln Laboratory, Lexington, Massachusetts 02173
書誌事項
- 公開日
- 1983-04-15
- DOI
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- 10.1063/1.94032
- 公開者
- AIP Publishing
この論文をさがす
説明
<jats:p>Electrical connections have been formed in a new lateral link structure which uses polyimide in the gap between, and overlapping, two aluminum electrodes. An argon ion laser, with a pulse width of 1 ms and power levels of about 2 W, was used to locally graphitize the polyimide. One kilohm connections were formed reliably in links ranging in width between 4 and 15 μm and gap length between 2 and 5 μm. This technique is the simplest yet proposed for restructuring the connections on an integrated circuit, after fabrication and test, in order to incorporate redundancy for yield improvement.</jats:p>
収録刊行物
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- Applied Physics Letters
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Applied Physics Letters 42 (8), 705-706, 1983-04-15
AIP Publishing
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詳細情報 詳細情報について
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- CRID
- 1361699994529272064
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- DOI
- 10.1063/1.94032
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- ISSN
- 10773118
- 00036951
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- データソース種別
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- Crossref