High-sensitivity ferromagnetic resonance measurements on micrometer-sized samples

DOI PDF 被引用文献1件
  • S. Zhang
    Department of Electrical and Computer Engineering, Center for Electromagnetics Research, and Department of Physics, Northeastern University, Boston Massachusetts 02115
  • S. A. Oliver
    Department of Electrical and Computer Engineering, Center for Electromagnetics Research, and Department of Physics, Northeastern University, Boston Massachusetts 02115
  • N. E. Israeloff
    Department of Electrical and Computer Engineering, Center for Electromagnetics Research, and Department of Physics, Northeastern University, Boston Massachusetts 02115
  • C. Vittoria
    Department of Electrical and Computer Engineering, Center for Electromagnetics Research, and Department of Physics, Northeastern University, Boston Massachusetts 02115

書誌事項

公開日
1997-05-19
DOI
  • 10.1063/1.118974
公開者
AIP Publishing

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説明

<jats:p>Ferromagnetic resonance measurements were taken on a 4 μm diam disk using a planar microwave transmission line device. The absorption modes of a sample placed on this device can be measured by monitoring the microwave power transmitted across the device while a swept magnetic field varies the sample absorption through resonance. Results for the disk, which was etched from a 105 nm thick amorphous Fe80B15Si5 film, followed the Kittel model over the frequency range from 2 to 20 GHz, in agreement with parameters measured on 5 mm diam disks by a microwave cavity. These results indicate the device has a sensitivity of 3×109⋅ΔH spins, almost two orders of magnitude better than microwave cavity measurements.</jats:p>

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