Parallel plate analyser with second order focusing property

W Schmitz, W Mehlhorn

doi:10.1088/0022-3735/5/1/023

Parallel plate analyser with second order focusing property

DOI Web Site Web Site 被引用文献1件

書誌事項

公開日: 1972-01-01

権利情報

https://iopscience.iop.org/page/copyright
https://iopscience.iop.org/info/page/text-and-data-mining

DOI

10.1088/0022-3735/5/1/023

公開者: IOP Publishing

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説明

<jats:p>The optical properties are studied of three different parallel plate analysers using point sources, the usual pi /4 analyser with first order focusing and two versions of the pi /6 analyser with second order focusing. It is shown that the ratio of the transmission to the resolution of a modified pi /6 analyser, constructed in a 2 pi geometry, is superior to all other electrostatic analysers having a 2 pi geometry. Because parallel plate analysers with 2 pi geometry have the disadvantage of large ring detectors, sector shaped analysers with Delta phi <<2 pi , requiring only commercially available particle detectors, have also been investigated. The modified pi /6 analyser is also superior to the other parallel plate analysers.</jats:p>