Effects of interface states on the transport properties of all-oxide La0.8Sr0.2CoO3∕SrTi0.99Nb0.01O3 p-n heterojunctions

  • F. Y. Bruno
    Universidad Complutense de Madrid 1 GFMC, Departamento Fisica Aplicada III, , 28040 Madrid, Spain
  • J. Garcia-Barriocanal
    Universidad Complutense de Madrid 1 GFMC, Departamento Fisica Aplicada III, , 28040 Madrid, Spain
  • M. Torija
    University of Minnesota 2 Department of Chemical Engineering and Materials Science, , Minneapolis, Minnesota 55455, USA
  • A. Rivera
    Universidad Complutense de Madrid 1 GFMC, Departamento Fisica Aplicada III, , 28040 Madrid, Spain
  • Z. Sefrioui
    Universidad Complutense de Madrid 1 GFMC, Departamento Fisica Aplicada III, , 28040 Madrid, Spain
  • C. Leighton
    University of Minnesota 2 Department of Chemical Engineering and Materials Science, , Minneapolis, Minnesota 55455, USA
  • C. Leon
    Universidad Complutense de Madrid 1 GFMC, Departamento Fisica Aplicada III, , 28040 Madrid, Spain
  • J. Santamaria
    Universidad Complutense de Madrid 1 GFMC, Departamento Fisica Aplicada III, , 28040 Madrid, Spain

書誌事項

公開日
2008-02-25
DOI
  • 10.1063/1.2887905
公開者
AIP Publishing

この論文をさがす

説明

<jats:p>Electrical transport properties of heteroepitaxial p-n junctions made of La0.8Sr0.2CoO3 and SrTi0.99Nb0.01O3 were studied. Junctions display highly rectifying current-voltage characteristics over a wide temperature range (20–300K). Two distinct transport mechanisms are identified: tunneling assisted by interface states at T&lt;130K and diffusion/recombination at higher temperatures. Capacitance-voltage characteristics are used to determine the junction built-in potential at different frequencies. A capacitance relaxation is found due to charge trapping at interface states. Interface states, which deeply affect transport, are discussed in connection to charge-transfer processes related to the polarity mismatch at the interface.</jats:p>

収録刊行物

被引用文献 (2)*注記

もっと見る

詳細情報 詳細情報について

問題の指摘

ページトップへ