Generation of Oxide Charge and Interface States by Ionizing Radiation and by Tunnel Injection Experiments
書誌事項
- 公開日
- 1982-12
- 権利情報
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- https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
- DOI
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- 10.1109/tns.1982.4336389
- 公開者
- Institute of Electrical and Electronics Engineers (IEEE)
この論文をさがす
収録刊行物
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- IEEE Transactions on Nuclear Science
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IEEE Transactions on Nuclear Science 29 (6), 1471-1478, 1982-12
Institute of Electrical and Electronics Engineers (IEEE)