Layer-Aware Program-and-Read Schemes for 3D Stackable Vertical-Gate BE-SONOS NAND Flash Against Cross-Layer Process Variations

Details 詳細情報について

• CRID

  1361699995775450752

• DOI

  10.1109/jssc.2015.2413841

• ISSN

  1558173X

  00189200

• Web Site

  http://xplorestaging.ieee.org/ielx7/4/7112217/07084680.pdf?arnumber=7084680

• Data Source

  • Crossref