A new large radius imaging plate camera for high-resolution and high-throughput synchrotron x-ray powder diffraction by multiexposure method
-
- Masahiko Tanaka
- National Institute for Materials Science 1 NIMS Beamline Station at SPring-8, , 1-1-1 Kouto, Sayo-cho, Hyogo 679-5148, Japan
-
- Yoshio Katsuya
- SPring-8 Service Co. Ltd. 2 , 1-1-1 Kouto, Sayo-cho, Hyogo 679-5148, Japan
-
- Akiji Yamamoto
- National Institute for Materials Science 3 , 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan
書誌事項
- 公開日
- 2008-07-01
- DOI
-
- 10.1063/1.2956972
- 公開者
- AIP Publishing
この論文をさがす
説明
<jats:p>A new large radius imaging plate diffraction camera for high-resolution and high-throughput synchrotron x-ray powder diffraction by means of multiple exposures has been developed for an insertion device beamline of SPring-8, Japan. The new imaging plate camera consists of a large radius cylindrical shape imaging plate cassette that is 400mm in length and 954.9mm in cylinder radius. The cassette is designed to be mounted on the 2θ arm of the diffractometer of BL15XU in SPring-8. One imaging plate covers 24° and several times of exposure changing the 2θ-setting angle is necessary to obtain whole powder diffraction data up to a high angle region. One pixel of the imaging plate corresponds to 0.003° in 2θ when the readout pixel size is 50μm squares. Separately collected data are translated to 2θ-intensity format and are connected by comparing the peak and background intensity included in the overlapped area. The exposure time is less than 120s for most samples and the readout time is about 3min; thus, the total measurement time for one powder diffraction pattern is less than 20min. The measurement time is the same order as the continuous 2θ-scanning method of the third generation synchrotron powder diffractometer. The angular resolution of the new imaging plate camera was evaluated by comparing the full width at half maximum of the 111 reflection of NBS-Si. The observed angular resolution is not so high as a powder diffractometer with a Si or a Ge analyzer monochromator in the third generation synchrotron facility but higher than a powder diffractometer with a Ge analyzer monochromator at a bending magnet beamline of the second generation synchrotron. The Rietveld analysis of NBS-CeO2 was successfully carried out with the data taken by the new imaging plate camera.</jats:p>
収録刊行物
-
- Review of Scientific Instruments
-
Review of Scientific Instruments 79 (7), 075106-, 2008-07-01
AIP Publishing