Morphology and mobility as tools to control and unprecedentedly enhance X-ray sensitivity in organic thin-films
説明
<jats:title>Abstract</jats:title><jats:p>Organic semiconductor materials exhibit a great potential for the realization of large-area solution-processed devices able to directly detect high-energy radiation. However, only few works investigated on the mechanism of ionizing radiation detection in this class of materials, so far. In this work we investigate the physical processes behind X-ray photoconversion employing bis-(triisopropylsilylethynyl)-pentacene thin-films deposited by bar-assisted meniscus shearing. The thin film coating speed and the use of bis-(triisopropylsilylethynyl)-pentacene:polystyrene blends are explored as tools to control and enhance the detection capability of the devices, by tuning the thin-film morphology and the carrier mobility. The so-obtained detectors reach a record sensitivity of 1.3 · 10<jats:sup>4</jats:sup> µC/Gy·cm<jats:sup>2</jats:sup>, the highest value reported for organic-based direct X-ray detectors and a very low minimum detectable dose rate of 35 µGy/s. Thus, the employment of organic large-area direct detectors for X-ray radiation in real-life applications can be foreseen.</jats:p>
収録刊行物
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- Nature Communications
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Nature Communications 11 (1), 2020-05-01
Springer Science and Business Media LLC
