Electrical and reliability characteristics of Mn-doped nano BaTiO3-based ceramics for ultrathin multilayer ceramic capacitor application
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- Huiling Gong
- Tsinghua University State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, , Beijing 100084, China
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- Xiaohui Wang
- Tsinghua University State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, , Beijing 100084, China
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- Shaopeng Zhang
- Tsinghua University State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, , Beijing 100084, China
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- Zhibin Tian
- Tsinghua University State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, , Beijing 100084, China
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- Longtu Li
- Tsinghua University State Key Lab of New Ceramics and Fine Processing, Department of Materials Science and Engineering, , Beijing 100084, China
書誌事項
- 公開日
- 2012-12-01
- DOI
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- 10.1063/1.4768892
- 公開者
- AIP Publishing
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説明
<jats:p>Nano BaTiO3-based dielectric ceramics were prepared by chemical coating approach, which are promising for ultrathin multilayer ceramic capacitor (MLCC) applications. The doping effects of Mn element on the microstructures and dielectric properties of the ceramics were investigated. The degradation test and impedance spectroscopy were employed to study the resistance degradation and the conduction mechanism of Mn-doped nano-BaTiO3 ceramic samples. It has been found that the reliability characteristics greatly depended on the Mn-doped content. Moreover, the BaTiO3 ceramic with grain size in nanoscale is more sensitive to the Mn-doped content than that in sub-micron scale. The addition of 0.3 mol. % Mn is beneficial for improving the reliability of the nano BaTiO3-based ceramics, which is an important parameter for MLCC applications. However, further increasing the addition amount will deteriorate the performance of the ceramic samples.</jats:p>
収録刊行物
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- Journal of Applied Physics
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Journal of Applied Physics 112 (11), 2012-12-01
AIP Publishing