Hot‐Pressed CsPbBr<sub>3</sub> Quasi‐Monocrystalline Film for Sensitive Direct X‐ray Detection
-
- Weicheng Pan
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Bo Yang
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Guangda Niu
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Kan‐Hao Xue
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Xinyuan Du
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Lixiao Yin
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Muyi Zhang
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Haodi Wu
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Xiang‐Shui Miao
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
-
- Jiang Tang
- Wuhan National Laboratory for Optoelectronics and School of Optical and Electronic Information Huazhong University of Science and Technology Wuhan 430074 Hubei Province China
書誌事項
- 公開日
- 2019-09-16
- 権利情報
-
- http://onlinelibrary.wiley.com/termsAndConditions#vor
- DOI
-
- 10.1002/adma.201904405
- 公開者
- Wiley
この論文をさがす
説明
<jats:title>Abstract</jats:title><jats:p>An X‐ray detector with high sensitivity would be able to increase the generated signal and reduce the dose rate; thus, this type of detector is beneficial for applications such as medical imaging and product inspection. The inorganic lead halide perovskite CsPbBr<jats:sub>3</jats:sub> possesses relatively larger density and a higher atomic number in contrast to its hybrid counterpart. Therefore, it is expected to provide high detection sensitivity for X‐rays; however, it has rarely been studied as a direct X‐ray detector. Here, a hot‐pressing method is employed to fabricate thick quasi‐monocrystalline CsPbBr<jats:sub>3</jats:sub> films, and a record sensitivity of 55 684 µC Gy<jats:sub>air</jats:sub><jats:sup>−1</jats:sup> cm<jats:sup>−2</jats:sup> is achieved, surpassing all other X‐ray detectors (direct and indirect). The hot‐pressing method is simple and produces thick quasi‐monocrystalline CsPbBr<jats:sub>3</jats:sub> films with uniform orientations. The high crystalline quality of the CsPbBr<jats:sub>3</jats:sub> films and the formation of self‐formed shallow bromide vacancy defects during the high‐temperature process result in a large <jats:italic>µτ</jats:italic> product and, therefore, a high photoconductivity gain factor and high detection sensitivity. The detectors also exhibit relatively fast response speed, negligible baseline drift, and good stability, making a CsPbBr<jats:sub>3</jats:sub> X‐ray detector extremely competitive for high‐contrast X‐ray detections.</jats:p>
収録刊行物
-
- Advanced Materials
-
Advanced Materials 31 (44), 1904405-, 2019-09-16
Wiley
