Angular X-ray Cross-Correlation Analysis (AXCCA): Basic Concepts and Recent Applications to Soft Matter and Nanomaterials
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- Ivan Zaluzhnyy
- Department of Physics, University of California San Diego, La Jolla, San Diego, CA 92093, USA
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- Ruslan Kurta
- European XFEL, Holzkoppel 4, D-22869 Schenefeld, Germany
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- Marcus Scheele
- Institute of Physical and Theoretical Chemistry, University of Tübingen, Auf der Morgenstelle 18, 72076 Tübingen, Germany
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- Frank Schreiber
- Center for Light-Matter Interaction, Sensors & Analytics LISA+, University of Tübingen, Auf der Morgenstelle 15, 72076 Tübingen, Germany
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- Boris Ostrovskii
- Federal Scientific Research Center “Crystallography and Photonics”, Russian Academy of Sciences, Leninskii Prospect 59, 119333 Moscow, Russia
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- Ivan Vartanyants
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, D-22607 Hamburg, Germany
説明
<jats:p>Angular X-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of X-ray diffraction patterns and provides insights into the orientational order in the system under investigation. This method is based on the evaluation of the angular cross-correlation function of the scattered intensity distribution on a two-dimensional (2D) detector and further averaging over many diffraction patterns for enhancement of the anisotropic signal. Over the last decade, AXCCA was successfully used to study the anisotropy in various soft matter systems, such as solutions of anisotropic particles, liquid crystals, colloidal crystals, superlattices composed by nanoparticles, etc. This review provides an introduction to the technique and gives a survey of the recent experimental work in which AXCCA in combination with micro- or nanofocused X-ray microscopy was used to study the orientational order in various soft matter systems.</jats:p>
収録刊行物
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- Materials
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Materials 12 (21), 3464-, 2019-10-23
MDPI AG
