A development in the preparation of sharp scanning tunneling microscopy tips

DOI PDF 被引用文献2件
  • J. P. Song
    Laboratory of Applied Physics and Danish Institute of Fundamental Metrology, Building 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
  • N. H. Pryds
    Laboratory of Applied Physics, Building 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
  • K. Glejbo/l
    Laboratory of Applied Physics, Building 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
  • K. A. Mo/rch
    Laboratory of Applied Physics, Building 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
  • A. R. Thölén
    Laboratory of Applied Physics, Building 307, Technical University of Denmark, DK-2800 Lyngby, Denmark
  • L. N. Christensen
    Laboratory of Applied Physics, Building 307, Technical University of Denmark, DK-2800 Lyngby, Denmark

書誌事項

公開日
1993-04-01
DOI
  • 10.1063/1.1144140
公開者
AIP Publishing

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説明

<jats:p>An improved and reliable method for making sharp scanning tunneling microscopy (STM) tips is described. It is based on the widely used drop-off electrochemical etching procedure, here modified to improve the control of the tip shape. A second etching is applied not only to remove the oxide layer from the tip surface, but also to sharpen the STM tips further. A tip radius less than 20 nm can be obtained reproducibly. The quality of the produced tips was inspected with transmission electron microscopy, and micrographs of tips produced with different times of second etching are shown. To produce tips which are all without an oxide layer an electronic phase control unit is necessary. Even without this etch controller more than half the tips are oxide free, and then only standard laboratory equipment is used for the tip production.</jats:p>

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