Synthesis and attachment of silver nanowires on atomic force microscopy cantilevers for tip‐enhanced Raman spectroscopy

DOI Web Site Web Site 被引用文献2件
  • Pierre Brodard
    EMPA, Swiss Federal Laboratories for Materials Science and Technology Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 CH‐3602 THUN Switzerland
  • Mikhael Bechelany
    Institut Européen des Membranes (UMR CNRS 5635) Université Montpellier 2, Place Eugène Bataillon 34095 Montpellier France
  • Laetitia Philippe
    EMPA, Swiss Federal Laboratories for Materials Science and Technology Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 CH‐3602 THUN Switzerland
  • Johann Michler
    EMPA, Swiss Federal Laboratories for Materials Science and Technology Laboratory for Mechanics of Materials and Nanostructures Feuerwerkerstrasse 39 CH‐3602 THUN Switzerland

書誌事項

公開日
2011-10-27
権利情報
  • http://onlinelibrary.wiley.com/termsAndConditions#vor
DOI
  • 10.1002/jrs.3091
公開者
Wiley

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説明

<jats:p>Surface‐enhanced Raman spectroscopy is based on the absorption of light by nanometer‐sized metal particles, resulting in large enhancement of the Raman signal. By replacing the metal particles by a metallic nanotip, the enhancement can be localized. The resulting tip‐enhanced Raman spectroscopy is capable of measuring Raman spectra with high spatial resolution, effectively overcoming the diffraction limit. A successful tip‐enhanced Raman spectroscopy experiment depends heavily on the ability to fabricate tips of a definite metal with the appropriate shape and size, which is still a challenging process. We have prepared silver nanowires with a diameter of 200–300 nm by templated electrochemical deposition and attached them onto atomic force microscope cantilevers by focused electron beam induced deposition. We found that they produce a reproducible enhancement of the Raman signal intensity. Other metals and smaller nanostructures might also be produced, suggesting an interesting development potential for these novel nanoprobes. Copyright © 2011 John Wiley & Sons, Ltd.</jats:p>

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