Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

DOI PDF 1 Citations

Journal

IEEE Transactions on Nuclear Science

IEEE Transactions on Nuclear Science 65 (1), 19-26, 2018-01

Institute of Electrical and Electronics Engineers (IEEE)

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Details 詳細情報について

CRID

1361981471090567936
DOI

10.1109/tns.2017.2764852
ISSN

15581578

00189499
Web Site

http://xplorestaging.ieee.org/ielx7/23/8263287/08076888.pdf?arnumber=8076888
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